{"id":1052,"date":"2013-09-05T16:28:05","date_gmt":"2013-09-05T16:28:05","guid":{"rendered":"http:\/\/nanovea.com\/?p=1052"},"modified":"2019-07-31T14:45:04","modified_gmt":"2019-07-31T14:45:04","slug":"gofret-dizi-duzluk-olcumu-kullanarak-3d-profilometri","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/wafer-array-flatness-measurement-using-3d-profilometry\/","title":{"rendered":"3D Profilometri Kullanarak Wafer D\u00fczl\u00fck \u00d6l\u00e7\u00fcm\u00fc"},"content":{"rendered":"<p>Bu uygulamada Nanovea ST400 <a title=\"profilometre\" href=\"https:\/\/nanovea.com\/profilometers\" target=\"_blank\" rel=\"noopener noreferrer\">Profilometre<\/a> bir wafer dizisinin kesitini \u00f6l\u00e7mek i\u00e7in kullan\u0131l\u0131r. \u00d6l\u00e7\u00fclen alan rastgele se\u00e7ilmi\u015ftir ve \u00e7ok daha b\u00fcy\u00fck bir y\u00fczey hakk\u0131nda varsay\u0131mlarda bulunmak i\u00e7in tahmin edilebilecek kadar b\u00fcy\u00fck oldu\u011fu varsay\u0131lm\u0131\u015ft\u0131r. Y\u00fczey <a title=\"d\u00fczl\u00fck \u00f6l\u00e7\u00fcm\u00fc\" href=\"https:\/\/nanovea.com\/surface-flatness-measurement\" target=\"_blank\" rel=\"noopener noreferrer\">d\u00fczl\u00fck \u00f6l\u00e7\u00fcm\u00fc<\/a>, d\u00fczlemsellik ve di\u011fer y\u00fczey parametreleri y\u00fczeyi analiz etmek i\u00e7in kullan\u0131l\u0131r.<\/p>\n<p><a href=\"https:\/\/nanovea.com\/wp-content\/themes\/wp-nanovea\/Application%20Notes\/wafer-array-flatness.pdf\"><br \/>\n3D Profilometri Kullanarak Wafer D\u00fczl\u00fck \u00d6l\u00e7\u00fcm\u00fc<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>In this application the Nanovea ST400 Profilometer is used to measure the section of a wafer array. The area measured was selected at random, and assumed large enough in that it could be extrapolated to make assumptions about a much larger surface. Surface flatness measurement, planarity &amp; other surface parameters are used to analyze the [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":1053,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,354],"tags":[153],"class_list":["post-1052","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-flatness-warpage","tag-flatness-measurement"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/1052","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=1052"}],"version-history":[{"count":4,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/1052\/revisions"}],"predecessor-version":[{"id":6629,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/1052\/revisions\/6629"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/1053"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=1052"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=1052"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=1052"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}