{"id":10121,"date":"2020-12-29T22:20:45","date_gmt":"2020-12-29T22:20:45","guid":{"rendered":"https:\/\/nanovea.com\/?p=10121"},"modified":"2025-05-22T20:48:07","modified_gmt":"2025-05-22T20:48:07","slug":"yuksek-sicaklikta-yerinde-asinma-olcumu","status":"publish","type":"post","link":"https:\/\/nanovea.com\/tr\/in-situ-wear-measurement-at-high-temperature\/","title":{"rendered":"Y\u00fcksek S\u0131cakl\u0131kta Yerinde A\u015f\u0131nma \u00d6l\u00e7\u00fcm\u00fc"},"content":{"rendered":"
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YERINDE A\u015eINMA \u00d6L\u00c7\u00dcM\u00dc\nY\u00dcKSEK SICAKLIKTA<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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TRIBOMETRE KULLANARAK<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Taraf\u0131ndan haz\u0131rlanm\u0131\u015ft\u0131r<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Duanjie Li, PhD<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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G\u0130R\u0130\u015e<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Do\u011frusal De\u011fi\u015fken Diferansiyel Transformat\u00f6r (LVDT), do\u011frusal yer de\u011fi\u015ftirmeyi \u00f6l\u00e7mek i\u00e7in kullan\u0131lan bir t\u00fcr sa\u011flam elektrik transformat\u00f6r\u00fcd\u00fcr. G\u00fc\u00e7 t\u00fcrbinleri, hidrolik, otomasyon, u\u00e7ak, uydular, n\u00fckleer reakt\u00f6rler ve di\u011ferleri dahil olmak \u00fczere \u00e7e\u015fitli end\u00fcstriyel uygulamalarda yayg\u0131n olarak kullan\u0131lmaktad\u0131r.<\/p>\n

Bu \u00e7al\u0131\u015fmam\u0131zda NANOVEA'n\u0131n LVDT ve y\u00fcksek s\u0131cakl\u0131k mod\u00fcllerinin eklentilerine yer verdik. Tribometre<\/a> bu, test edilen numunenin a\u015f\u0131nma izi derinli\u011findeki de\u011fi\u015fikli\u011fin, y\u00fcksek s\u0131cakl\u0131klardaki a\u015f\u0131nma i\u015flemi s\u0131ras\u0131nda \u00f6l\u00e7\u00fclmesine olanak tan\u0131r. Bu, kullan\u0131c\u0131lar\u0131n a\u015f\u0131nma s\u00fcrecinin farkl\u0131 a\u015famalar\u0131n\u0131 COF'nin geli\u015fimi ile ili\u015fkilendirmesine olanak tan\u0131r; bu, y\u00fcksek s\u0131cakl\u0131k uygulamalar\u0131 i\u00e7in a\u015f\u0131nma mekanizmas\u0131n\u0131n ve malzemelerin tribolojik \u00f6zelliklerinin temel anlay\u0131\u015f\u0131n\u0131n geli\u015ftirilmesinde kritik \u00f6neme sahiptir.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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\u00d6L\u00c7\u00dcM HEDEFI<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Bu \u00e7al\u0131\u015fmada, NANOVEA T50 Tribometre'nin y\u00fcksek s\u0131cakl\u0131klarda malzemelerin a\u015f\u0131nma s\u00fcrecinin geli\u015fimini yerinde izleme kapasitesini sergilemek istiyoruz.<\/i><\/p>

Al\u00fcmina silikat serami\u011fin farkl\u0131 s\u0131cakl\u0131klardaki a\u015f\u0131nma s\u00fcreci kontroll\u00fc ve izlenebilir bir \u015fekilde sim\u00fcle edilmi\u015ftir.<\/i><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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NANOVEA<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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T50<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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TEST PROSED\u00dcR\u00dc<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Al\u00fcmina silikat seramik plakalar\u0131n tribolojik davran\u0131\u015f\u0131, \u00f6rne\u011fin s\u00fcrt\u00fcnme katsay\u0131s\u0131, COF ve a\u015f\u0131nma direnci NANOVEA Tribometre ile de\u011ferlendirilmi\u015ftir. Al\u00fcmina silikat seramik plaka, oda s\u0131cakl\u0131\u011f\u0131ndan (RT) y\u00fcksek s\u0131cakl\u0131klara (400\u00b0C ve 800\u00b0C) kadar bir f\u0131r\u0131n ile \u0131s\u0131t\u0131lm\u0131\u015f ve ard\u0131ndan bu s\u0131cakl\u0131klarda a\u015f\u0131nma testleri yap\u0131lm\u0131\u015ft\u0131r.\u00a0<\/p>

Kar\u015f\u0131la\u015ft\u0131rma i\u00e7in, a\u015f\u0131nma testleri numune 800\u00b0C'den 400\u00b0C'ye ve ard\u0131ndan oda s\u0131cakl\u0131\u011f\u0131na so\u011futuldu\u011funda ger\u00e7ekle\u015ftirilmi\u015ftir. Test edilen numunelere bir AI2O3 bilye ucu (6 mm \u00e7ap, S\u0131n\u0131f 100) uygulanm\u0131\u015ft\u0131r. COF, a\u015f\u0131nma derinli\u011fi ve s\u0131cakl\u0131k yerinde izlenmi\u015ftir.<\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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TEST PARAMETRELERI<\/i><\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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pin-on-disk \u00f6l\u00e7\u00fcm\u00fcn\u00fcn<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"Tribometre\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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A\u015f\u0131nma oran\u0131, K, K=V\/(Fxs)=A\/(Fxn) form\u00fcl\u00fc kullan\u0131larak de\u011ferlendirilmi\u015ftir; burada V a\u015f\u0131nan hacim, F normal y\u00fck, s kayma mesafesi, A a\u015f\u0131nma izinin kesit alan\u0131 ve n devir say\u0131s\u0131d\u0131r. Y\u00fczey p\u00fcr\u00fczl\u00fcl\u00fc\u011f\u00fc ve a\u015f\u0131nma izi profilleri NANOVEA Optik Profilleyici ile de\u011ferlendirilmi\u015f ve a\u015f\u0131nma izi morfolojisi optik mikroskop kullan\u0131larak incelenmi\u015ftir.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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SONU\u00c7LAR & TARTI\u015eMA<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Yerinde kaydedilen COF ve a\u015f\u0131nma izi derinli\u011fi s\u0131ras\u0131yla \u015eEK\u0130L 1 ve \u015eEK\u0130L 2'de g\u00f6sterilmektedir. \u015eEK\u0130L 1'de \"-I\", s\u0131cakl\u0131k RT'den y\u00fcksek bir s\u0131cakl\u0131\u011fa \u00e7\u0131kar\u0131ld\u0131\u011f\u0131nda ger\u00e7ekle\u015ftirilen testi g\u00f6stermektedir. \"-D\" 800\u00b0C'lik daha y\u00fcksek bir s\u0131cakl\u0131ktan d\u00fc\u015f\u00fcr\u00fclen s\u0131cakl\u0131\u011f\u0131 temsil etmektedir.<\/p>

\u015eEK\u0130L 1'de g\u00f6sterildi\u011fi gibi, farkl\u0131 s\u0131cakl\u0131klarda test edilen numuneler, \u00f6l\u00e7\u00fcmler boyunca ~0,6'l\u0131k kar\u015f\u0131la\u015ft\u0131r\u0131labilir bir COF sergilemektedir. Bu kadar y\u00fcksek bir COF, \u00f6nemli miktarda d\u00f6k\u00fcnt\u00fc olu\u015fturan h\u0131zland\u0131r\u0131lm\u0131\u015f bir a\u015f\u0131nma s\u00fcrecine yol a\u00e7ar. A\u015f\u0131nma izi derinli\u011fi, a\u015f\u0131nma testleri s\u0131ras\u0131nda \u015eEK\u0130L 2'de g\u00f6sterildi\u011fi gibi LVDT ile izlenmi\u015ftir. Numune \u0131s\u0131t\u0131lmadan \u00f6nce oda s\u0131cakl\u0131\u011f\u0131nda ve numune so\u011futulduktan sonra yap\u0131lan testler, al\u00fcmina silikat seramik plakan\u0131n RT'de a\u015famal\u0131 bir a\u015f\u0131nma s\u00fcreci sergiledi\u011fini, a\u015f\u0131nma izi derinli\u011finin a\u015f\u0131nma testi boyunca kademeli olarak s\u0131ras\u0131yla ~170 ve ~150 \u03bcm'ye y\u00fckseldi\u011fini g\u00f6stermektedir.\u00a0<\/span><\/p>

Buna kar\u015f\u0131l\u0131k, y\u00fcksek s\u0131cakl\u0131klardaki (400\u00b0C ve 800\u00b0C) a\u015f\u0131nma testleri farkl\u0131 bir a\u015f\u0131nma davran\u0131\u015f\u0131 sergilemektedir - a\u015f\u0131nma izi derinli\u011fi a\u015f\u0131nma s\u00fcrecinin ba\u015f\u0131nda h\u0131zla artmakta ve test devam ettik\u00e7e yava\u015flamaktad\u0131r. 400\u00b0C-I, 800\u00b0C ve 400\u00b0C-D s\u0131cakl\u0131klar\u0131nda ger\u00e7ekle\u015ftirilen testler i\u00e7in a\u015f\u0131nma izi derinlikleri s\u0131ras\u0131yla ~140, ~350 ve ~210 \u03bcm'dir.<\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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\u015eEK\u0130L 1. <\/i><\/b>\nFarkl\u0131 s\u0131cakl\u0131klarda pin-on-disk testleri s\u0131ras\u0131nda S\u00fcrt\u00fcnme Katsay\u0131s\u0131<\/span><\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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\u015eEK\u0130L 2. <\/i><\/b>\nFarkl\u0131 s\u0131cakl\u0131klarda al\u00fcmina silikat seramik plakan\u0131n a\u015f\u0131nma izi derinli\u011finin evrimi<\/span> \n
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Al\u00fcmina silikat seramik plakalar\u0131n farkl\u0131 s\u0131cakl\u0131klardaki ortalama a\u015f\u0131nma oran\u0131 ve a\u015f\u0131nma izi derinli\u011fi NANOVEA<\/i><\/b> Optical Profiler'da \u00f6zetlendi\u011fi gibi \u015eEK\u0130L 3<\/i><\/b>. A\u015f\u0131nma izi derinli\u011fi LVDT kullan\u0131larak kaydedilenle uyumludur. Al\u00fcmina silikat seramik plaka, 400\u00b0C'nin alt\u0131ndaki s\u0131cakl\u0131klarda 0,2mm3\/N'nin alt\u0131ndaki a\u015f\u0131nma oranlar\u0131na k\u0131yasla 800\u00b0C'de ~0,5 mm3\/Nm'lik \u00f6nemli \u00f6l\u00e7\u00fcde artm\u0131\u015f bir a\u015f\u0131nma oran\u0131 g\u00f6stermektedir. Al\u00fcmina silikat seramik plaka, k\u0131sa \u0131s\u0131tma i\u015fleminden sonra \u00f6nemli \u00f6l\u00e7\u00fcde geli\u015fmi\u015f mekanik\/tribolojik \u00f6zellikler sergilememekte, \u0131s\u0131l i\u015flemden \u00f6nce ve sonra kar\u015f\u0131la\u015ft\u0131r\u0131labilir bir a\u015f\u0131nma oran\u0131na sahip olmaktad\u0131r.<\/p>

Lav ve harika ta\u015f olarak da bilinen al\u00fcmina silikat seramik, \u0131s\u0131tma i\u015fleminden \u00f6nce yumu\u015fak ve i\u015flenebilirdir. 1093\u00b0C'ye kadar y\u00fcksek s\u0131cakl\u0131klarda uzun bir f\u0131r\u0131nlama i\u015flemi, sertli\u011fini ve mukavemetini \u00f6nemli \u00f6l\u00e7\u00fcde art\u0131rabilir, ard\u0131ndan elmas i\u015fleme gerekir. B\u00f6ylesine benzersiz bir \u00f6zellik, al\u00fcmina silikat serami\u011fi heykelt\u0131ra\u015fl\u0131k i\u00e7in ideal bir malzeme haline getirir.<\/span><\/p>

Bu \u00e7al\u0131\u015fmada, k\u0131sa s\u00fcrede f\u0131r\u0131nlama i\u00e7in gerekli olandan daha d\u00fc\u015f\u00fck bir s\u0131cakl\u0131kta (800\u00b0C'ye kar\u015f\u0131 1093\u00b0C) \u0131s\u0131l i\u015flemin al\u00fcmina silikat serami\u011fin mekanik ve tribolojik \u00f6zelliklerini iyile\u015ftirmedi\u011fini ve bu malzemenin ger\u00e7ek uygulamalarda kullan\u0131lmadan \u00f6nce uygun \u015fekilde f\u0131r\u0131nlanmas\u0131n\u0131 gerekli bir i\u015flem haline getirdi\u011fini g\u00f6steriyoruz.<\/p>

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\u015eEK\u0130L 3. <\/i><\/b>\nFarkl\u0131 s\u0131cakl\u0131klarda numunenin a\u015f\u0131nma oran\u0131 ve a\u015f\u0131nma izi derinli\u011fi<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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SONU\u00c7<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Bu \u00e7al\u0131\u015fmadaki kapsaml\u0131 tribolojik analize dayanarak, al\u00fcmina silikat seramik plakan\u0131n oda s\u0131cakl\u0131\u011f\u0131ndan 800\u00b0C'ye kadar farkl\u0131 s\u0131cakl\u0131klarda kar\u015f\u0131la\u015ft\u0131r\u0131labilir s\u00fcrt\u00fcnme katsay\u0131s\u0131 sergiledi\u011fini g\u00f6steriyoruz. Bununla birlikte, 800\u00b0C'de ~0,5 mm3\/Nm'lik \u00f6nemli \u00f6l\u00e7\u00fcde artan bir a\u015f\u0131nma oran\u0131 g\u00f6stererek bu serami\u011fin uygun \u0131s\u0131l i\u015fleminin \u00f6nemini ortaya koymaktad\u0131r.<\/p>

NANOVEA Tribometreleri, 1000\u00b0C'ye kadar y\u00fcksek s\u0131cakl\u0131klardaki uygulamalar i\u00e7in malzemelerin tribolojik \u00f6zelliklerini de\u011ferlendirebilmektedir. Yerinde COF ve a\u015f\u0131nma izi derinli\u011fi \u00f6l\u00e7\u00fcmlerinin i\u015flevi, kullan\u0131c\u0131lar\u0131n a\u015f\u0131nma s\u00fcrecinin farkl\u0131 a\u015famalar\u0131n\u0131 COF'un evrimi ile ili\u015fkilendirmesine olanak tan\u0131r; bu, y\u00fcksek s\u0131cakl\u0131klarda kullan\u0131lan malzemelerin a\u015f\u0131nma mekanizmas\u0131n\u0131n ve tribolojik \u00f6zelliklerinin temel anlay\u0131\u015f\u0131n\u0131 geli\u015ftirmede kritik \u00f6neme sahiptir.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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NANOVEA Tribometreleri, ISO ve ASTM uyumlu rotatif ve lineer modlar\u0131 kullanarak hassas ve tekrarlanabilir a\u015f\u0131nma ve s\u00fcrt\u00fcnme testleri sunar ve iste\u011fe ba\u011fl\u0131 y\u00fcksek s\u0131cakl\u0131k a\u015f\u0131nmas\u0131, ya\u011flama ve tribo-korozyon mod\u00fclleri \u00f6nceden entegre edilmi\u015f tek bir sistemde mevcuttur. NANOVEA'n\u0131n e\u015fsiz \u00fcr\u00fcn yelpazesi, ince veya kal\u0131n, yumu\u015fak veya sert kaplamalar\u0131n, filmlerin ve alt tabakalar\u0131n t\u00fcm tribolojik \u00f6zelliklerini belirlemek i\u00e7in ideal bir \u00e7\u00f6z\u00fcmd\u00fcr.<\/p>

P\u00fcr\u00fczl\u00fcl\u00fck gibi di\u011fer y\u00fczey \u00f6l\u00e7\u00fcmlerine ek olarak a\u015f\u0131nma izlerinin y\u00fcksek \u00e7\u00f6z\u00fcn\u00fcrl\u00fckl\u00fc 3D g\u00f6r\u00fcnt\u00fclemesi i\u00e7in iste\u011fe ba\u011fl\u0131 3D Temass\u0131z Profilleyiciler mevcuttur.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"YERINDE\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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Benzer bir uygulaman\u0131z var m\u0131?<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\u015eIMDI BIR UZMANLA G\u00d6R\u00dc\u015e\u00dcN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tFI\u0307YATLANDIRMA VE DETAYLARI HIZLI ALIN<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"

IN SITU WEAR MEASUREMENT AT HIGH TEMPERATURE USING TRIBOMETER Prepared by Duanjie Li, PhD INTRODUCTION The Linear Variable Differential Transformer (LVDT) is a type of robust electrical transformer used to measure linear displacement. It has been widely used in a variety of industrial applications, including power turbines, hydraulics, automation, aircraft, satellites, nuclear reactors, and many […]<\/p>\n","protected":false},"author":7,"featured_media":9985,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,378,349,373,336],"tags":[],"class_list":["post-10121","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-high-temperature-tribology","category-laboratory-testing","category-rotational-tribology","category-tribology-testing"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/10121","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/users\/7"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/comments?post=10121"}],"version-history":[{"count":85,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/10121\/revisions"}],"predecessor-version":[{"id":24755,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/posts\/10121\/revisions\/24755"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media\/9985"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/media?parent=10121"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/categories?post=10121"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/tr\/wp-json\/wp\/v2\/tags?post=10121"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}