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Roughness Mapping Inspection Using 3D Profilometry

Surface defects of products derive from materials processing and product manufacturing. In-line surface quality inspection ensures the tightest quality control of the end products. The Nanovea 3D Non-Contact Profilometers utilize chromatic confocal technology with unique capability to determine roughness mapping of a sample without contact. The line sensor enables scanning the 3D profile of a large surface at a high speed. The roughness threshold calculated real-time by the analysis software serves as a fast and reliable pass/fail tool.

Roughness Mapping Inspection Using 3D Profilometry

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