{"id":3415,"date":"2018-07-30T19:27:21","date_gmt":"2018-07-30T19:27:21","guid":{"rendered":"https:\/\/nanovea.com\/?p=3415"},"modified":"2019-07-31T14:47:43","modified_gmt":"2019-07-31T14:47:43","slug":"automated-large-area-profilometry-pcb","status":"publish","type":"post","link":"https:\/\/nanovea.com\/pt\/automated-large-area-profilometry-pcb\/","title":{"rendered":"Perfilometria automatizada de grande \u00e1rea de PCB"},"content":{"rendered":"<p>A amplia\u00e7\u00e3o dos processos de fabrica\u00e7\u00e3o \u00e9 necess\u00e1ria para que as ind\u00fastrias cres\u00e7am e acompanhem as demandas constantemente crescentes. \u00c0 medida que o processo de fabrica\u00e7\u00e3o aumenta, as ferramentas utilizadas no controle de qualidade tamb\u00e9m precisam ser aumentadas. Essas ferramentas devem ser r\u00e1pidas para acompanhar o ritmo de produ\u00e7\u00e3o, mantendo ao mesmo tempo uma alta precis\u00e3o para atender aos limites de toler\u00e2ncia do produto. Aqui, a Nanovea HS2000 <a href=\"https:\/\/nanovea.com\/profilometers\/\">Profil\u00f4metro,\u00a0<\/a>com Line Sensor, mostra seu valor como instrumento de controle de qualidade com suas capacidades de profilometria r\u00e1pida, automatizada e de alta resolu\u00e7\u00e3o em grandes \u00e1reas.<\/p>\n<p><a href=\"https:\/\/www.youtube.com\/watch?v=9NuPHYFr5IY\">Clipe de v\u00eddeo<\/a> ou Nota de aplica\u00e7\u00e3o: <a href=\"http:\/\/nanovea.com\/\/App-Notes\/pcb-topography.pdf\">Perfilometria automatizada de grande \u00e1rea de PCB<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Scaling up of manufacturing processes is necessary for industries to grow and keep up with constantly increasing demands. As manufacturing process scales up, the tools used in quality control also need to be scaled up. These tools must be fast to keep up with the production rate, while still maintaining high accuracy to meet product [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":3408,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,350],"tags":[319],"class_list":["post-3415","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-geometry-shape","tag-large-area-profilometry"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts\/3415","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/comments?post=3415"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts\/3415\/revisions"}],"predecessor-version":[{"id":3418,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts\/3415\/revisions\/3418"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/media\/3408"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/media?parent=3415"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/categories?post=3415"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/tags?post=3415"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}