{"id":2950,"date":"2017-09-01T21:32:31","date_gmt":"2017-09-01T21:32:31","guid":{"rendered":"http:\/\/nanovea.com\/?p=2950"},"modified":"2019-07-31T14:45:46","modified_gmt":"2019-07-31T14:45:46","slug":"flatness-measuresment-screen-profilometry","status":"publish","type":"post","link":"https:\/\/nanovea.com\/pt\/flatness-measurement-screen-profilometry\/","title":{"rendered":"Medi\u00e7\u00e3o da planicidade da tela utilizando a r\u00e1pida perfilometria 3D"},"content":{"rendered":"<p><a href=\"https:\/\/nanovea.com\/surface-flatness-measurement\/\">Medi\u00e7\u00e3o de planicidade<\/a> \u00e9 uma qualidade de superf\u00edcie geom\u00e9trica importante na fabrica\u00e7\u00e3o de pe\u00e7as e montagens de precis\u00e3o. A planicidade da superf\u00edcie desempenha um papel vital no uso final do produto. Por exemplo, as pe\u00e7as que s\u00e3o conectadas de forma herm\u00e9tica ou \u00e0 prova de l\u00edquidos em uma \u00e1rea de superf\u00edcie exigem condi\u00e7\u00f5es de superf\u00edcie rigorosas de planicidade superior na face de contato. A planicidade da tela \u00e9 fundamental para a funcionalidade e est\u00e9tica de dispositivos eletr\u00f4nicos como celulares, almofadas e laptops. Qualquer imperfei\u00e7\u00e3o da planeza da tela pode criar uma impress\u00e3o e experi\u00eancia negativa do produto para o usu\u00e1rio.<\/p>\n<p>Ver <a href=\"https:\/\/youtu.be\/IjkGo8La2IU\">Clipe de v\u00eddeo<\/a> ou Leia o Relat\u00f3rio: <a href=\"https:\/\/nanovea.com\/App-Notes\/flatness-measurement.pdf\">Medi\u00e7\u00e3o da planicidade da tela utilizando a r\u00e1pida perfilometria 3D<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Flatness measurement is an important geometric surface quality in the manufacture of precision parts and assemblies. Flatness of the surface plays a vital role in the end use of the product. For example, the parts that are connected in an air-tight or liquid-tight manner across a surface area require stringent surface conditions of superior flatness [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":2951,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,354],"tags":[297],"class_list":["post-2950","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-flatness-warpage","tag-fast-flatness-measurement"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts\/2950","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/comments?post=2950"}],"version-history":[{"count":2,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts\/2950\/revisions"}],"predecessor-version":[{"id":3137,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts\/2950\/revisions\/3137"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/media\/2951"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/media?parent=2950"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/categories?post=2950"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/tags?post=2950"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}