{"id":18527,"date":"2022-04-05T17:27:55","date_gmt":"2022-04-05T17:27:55","guid":{"rendered":"https:\/\/nanovea.com\/?p=18527"},"modified":"2025-05-22T20:22:00","modified_gmt":"2025-05-22T20:22:00","slug":"fractografia-analise-utilizacao-3d-profilometria","status":"publish","type":"post","link":"https:\/\/nanovea.com\/pt\/fractografia-analise-utilizacao-3d-profilometria\/","title":{"rendered":"An\u00e1lise de Fractografia usando a Perfilometria 3D"},"content":{"rendered":"
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AN\u00c1LISE DA FRACTOGRAFIA<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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USANDO A PROFILOMETRIA 3D<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Preparado por<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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CRAIG LEISING<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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INTRODU\u00c7\u00c3O<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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A fractografia \u00e9 o estudo de caracter\u00edsticas em superf\u00edcies fraturadas e tem sido historicamente investigada via microsc\u00f3pio ou SEM. Dependendo do tamanho do recurso, um microsc\u00f3pio (recursos macro) ou SEM (recursos nano e micro) s\u00e3o selecionados para a an\u00e1lise de superf\u00edcie. Em \u00faltima an\u00e1lise, ambos permitem a identifica\u00e7\u00e3o do tipo de mecanismo de fratura. Embora eficaz, o microsc\u00f3pio tem limita\u00e7\u00f5es claras e o SEM na maioria dos casos, al\u00e9m da an\u00e1lise em n\u00edvel at\u00f4mico, \u00e9 impratic\u00e1vel para medi\u00e7\u00e3o de superf\u00edcie de fratura e carece de capacidade de uso mais ampla. Com os avan\u00e7os na tecnologia de medi\u00e7\u00e3o \u00f3ptica, o NANOVEA Perfil\u00f4metro 3D sem contato<\/a> \u00e9 agora considerado o instrumento de escolha, com sua capacidade de fornecer nanometria por meio de medi\u00e7\u00f5es de superf\u00edcie 2D e 3D em macroescala<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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IMPORT\u00c2NCIA DO PROFIL\u00d4METRO 3D SEM CONTATO PARA A INSPE\u00c7\u00c3O DE FRATURAS<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Ao contr\u00e1rio de um SEM, um Perfil\u00f4metro 3D sem contato pode medir quase qualquer superf\u00edcie, tamanho de amostra, com o m\u00ednimo de prepara\u00e7\u00e3o de amostra, tudo isso enquanto oferece dimens\u00f5es verticais\/horizontais superiores \u00e0s de um SEM. Com um perfilador, as caracter\u00edsticas de nano atrav\u00e9s de macro range s\u00e3o capturadas em uma \u00fanica medi\u00e7\u00e3o com influ\u00eancia zero da refletividade da amostra. Mede facilmente qualquer material: transparente, opaco, especular, difusivo, polido, rugoso, etc. O Profil\u00f4metro 3D sem contato oferece uma ampla e amig\u00e1vel capacidade para maximizar os estudos de fratura superficial a uma fra\u00e7\u00e3o do custo de um SEM.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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OBJETIVO DA MEDI\u00c7\u00c3O<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Nesta aplica\u00e7\u00e3o, o NANOVEA ST400 \u00e9 utilizado para medir a superf\u00edcie fraturada de uma amostra de a\u00e7o. Neste estudo, mostraremos uma \u00e1rea 3D, extra\u00e7\u00e3o do perfil 2D e mapa direcional da superf\u00edcie.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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NANOVEA<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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ST400<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\n\t\t\t\t\t\t\t\"Profil\u00f4metro\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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RESULTADOS<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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SUPERF\u00cdCIE TOP SUPERF\u00cdCIE<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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Dire\u00e7\u00e3o da textura da superf\u00edcie 3D<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Isotropia<\/td>51.26%<\/td><\/tr>
Primeira Dire\u00e7\u00e3o<\/td>123.2\u00ba<\/td><\/tr>
Segunda Dire\u00e7\u00e3o<\/td>116.3\u00ba<\/td><\/tr>
Terceira dire\u00e7\u00e3o<\/td>0.1725\u00ba<\/td><\/tr><\/tbody><\/table>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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\u00c1rea de superf\u00edcie, volume, rugosidade e muitos outros podem ser calculados automaticamente a partir desta extra\u00e7\u00e3o.<\/span> <\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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Extra\u00e7\u00e3o de perfil 2D<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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RESULTADOS<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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SUPERF\u00cdCIE LATERAL<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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Dire\u00e7\u00e3o da textura da superf\u00edcie 3D<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Isotropia<\/td>15.55<\/span>%<\/td><\/tr>
Primeira Dire\u00e7\u00e3o<\/td>0.1617<\/span>\u00ba<\/td><\/tr>
Segunda Dire\u00e7\u00e3o<\/td>110.5<\/span>\u00ba<\/td><\/tr>
Terceira dire\u00e7\u00e3o<\/td>171.5<\/span>\u00ba<\/td><\/tr><\/tbody><\/table>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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\u00c1rea de superf\u00edcie, volume, rugosidade e muitos outros podem ser calculados automaticamente a partir desta extra\u00e7\u00e3o.<\/span> <\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t

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Extra\u00e7\u00e3o de perfil 2D<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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CONCLUS\u00c3O<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Nesta aplica\u00e7\u00e3o, mostramos como o NANOVEA ST400 3D Non-Contact Profilometer pode caracterizar com precis\u00e3o a topografia completa (nano, micro e macro caracter\u00edsticas) de uma superf\u00edcie fraturada. Da \u00e1rea 3D, a superf\u00edcie pode ser claramente identificada e sub-\u00e1reas ou perfis\/se\u00e7\u00f5es transversais podem ser rapidamente extra\u00eddas e analisadas com uma lista intermin\u00e1vel de c\u00e1lculos de superf\u00edcie. As caracter\u00edsticas da superf\u00edcie sub nanom\u00e9trica podem ser analisadas com um m\u00f3dulo AFM integrado.<\/p>

Al\u00e9m disso, a NANOVEA incluiu uma vers\u00e3o port\u00e1til em sua linha de Perfis\u00f4metros, especialmente cr\u00edtica para estudos de campo onde uma superf\u00edcie de fratura \u00e9 im\u00f3vel. Com esta ampla lista de capacidades de medi\u00e7\u00e3o de superf\u00edcie, a an\u00e1lise da superf\u00edcie de fratura nunca foi t\u00e3o f\u00e1cil e mais conveniente com um \u00fanico instrumento.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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Tem um aplicativo semelhante?<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tCONVERSE COM UM ESPECIALISTA AGORA<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tOBTENHA PRE\u00c7OS E DETALHES RAPIDAMENTE<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"

FRACTOGRAPHY ANALYSIS USING 3D PROFILOMETRY Prepared by CRAIG LEISING INTRODUCTION Fractography is the study of features on fractured surfaces and has historically been investigated via Microscope or SEM. Depending on the size of the feature, a microscope (macro features) or SEM (nano and micro features) are selected for the surface analysis. Both ultimately allowing for […]<\/p>","protected":false},"author":1,"featured_media":18534,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,349,350,351,353,355,335],"tags":[],"class_list":["post-18527","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-laboratory-testing","category-profilometry-geometry-shape","category-profilometry-roughness-finish","category-profilometry-texture-grain","category-profilometry-volume-area","category-profilometry-testing"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts\/18527","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/comments?post=18527"}],"version-history":[{"count":29,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts\/18527\/revisions"}],"predecessor-version":[{"id":24705,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts\/18527\/revisions\/24705"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/media\/18534"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/media?parent=18527"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/categories?post=18527"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/tags?post=18527"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}