{"id":1243,"date":"2012-01-07T00:25:06","date_gmt":"2012-01-07T00:25:06","guid":{"rendered":"http:\/\/nanovea.com\/?p=1243"},"modified":"2015-06-18T16:35:41","modified_gmt":"2015-06-18T16:35:41","slug":"inspecao-de-pinos-de-conector-com-perfilometria-3d","status":"publish","type":"post","link":"https:\/\/nanovea.com\/pt\/connector-pin-inspection-with-3d-profilometry\/","title":{"rendered":"Inspe\u00e7\u00e3o de pinos de conex\u00e3o com perfilometria 3D"},"content":{"rendered":"<p>Nesta aplica\u00e7\u00e3o, o Nanovea ST400 <a title=\"profil\u00f4metro\" href=\"https:\/\/nanovea.com\/profilometers\" target=\"_blank\">Profil\u00f4metro<\/a> \u00e9 usado para medir a \u00e1rea total de uma superf\u00edcie de conector e seus pinos. A aplica\u00e7\u00e3o foi escolhida por suas caracter\u00edsticas desafiadoras ao mesmo tempo em que se destacam as op\u00e7\u00f5es de medi\u00e7\u00e3o com a t\u00e9cnica da Nanovea. H\u00e1 uma lista intermin\u00e1vel de par\u00e2metros de superf\u00edcie que podem ser calculados automaticamente ap\u00f3s a varredura da superf\u00edcie. Aqui revisaremos um perfil 3D completo, a planicidade da base do conector, a coplanaridade dos pinos e a rugosidade da ponta de um pino.<\/p>\n<p><a href=\"https:\/\/nanovea.com\/wp-content\/themes\/wp-nanovea\/Application%20Notes\/connector-pin-inspection.pdf\">Inspe\u00e7\u00e3o de pinos de conex\u00e3o com perfilometria 3D<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>In this application, the Nanovea ST400 Profilometer is used to measure the full area of a connector surface and its pins. The application was chosen for its challenging features while highlighting the measurement options with Nanovea\u2019s technique. There is an endless list surface parameters that can be automatically calculated after the surface scan. Here we [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":1244,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7],"tags":[183],"class_list":["post-1243","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","tag-connector-pin"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts\/1243","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/comments?post=1243"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts\/1243\/revisions"}],"predecessor-version":[{"id":1801,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/posts\/1243\/revisions\/1801"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/media\/1244"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/media?parent=1243"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/categories?post=1243"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/pt\/wp-json\/wp\/v2\/tags?post=1243"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}