{"id":3415,"date":"2018-07-30T19:27:21","date_gmt":"2018-07-30T19:27:21","guid":{"rendered":"https:\/\/nanovea.com\/?p=3415"},"modified":"2019-07-31T14:47:43","modified_gmt":"2019-07-31T14:47:43","slug":"automated-large-area-profilometry-pcb","status":"publish","type":"post","link":"https:\/\/nanovea.com\/pl\/automated-large-area-profilometry-pcb\/","title":{"rendered":"Zautomatyzowana profilometria du\u017cych powierzchni p\u0142ytek drukowanych"},"content":{"rendered":"<p>Skalowanie proces\u00f3w produkcyjnych jest konieczne, aby przemys\u0142 m\u00f3g\u0142 si\u0119 rozwija\u0107 i nad\u0105\u017ca\u0107 za stale rosn\u0105cymi wymaganiami. W miar\u0119 skalowania procesu produkcyjnego, narz\u0119dzia u\u017cywane w kontroli jako\u015bci r\u00f3wnie\u017c musz\u0105 by\u0107 skalowane. Narz\u0119dzia te musz\u0105 by\u0107 szybkie, aby nad\u0105\u017cy\u0107 za tempem produkcji, a jednocze\u015bnie zachowa\u0107 wysok\u0105 dok\u0142adno\u015b\u0107, aby spe\u0142ni\u0107 limity tolerancji produktu. Tutaj, Nanovea HS2000 <a href=\"https:\/\/nanovea.com\/profilometers\/\">Profilometr,\u00a0<\/a>z czujnikiem liniowym, pokazuje swoj\u0105 warto\u015b\u0107 jako instrument kontroli jako\u015bci z mo\u017cliwo\u015bci\u0105 szybkiej, zautomatyzowanej i wysokorozdzielczej profilometrii wielkopowierzchniowej.<\/p>\n<p><a href=\"https:\/\/www.youtube.com\/watch?v=9NuPHYFr5IY\">Klip wideo<\/a> lub App Note: <a href=\"http:\/\/nanovea.com\/\/App-Notes\/pcb-topography.pdf\">Zautomatyzowana profilometria du\u017cych powierzchni p\u0142ytek drukowanych<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Scaling up of manufacturing processes is necessary for industries to grow and keep up with constantly increasing demands. As manufacturing process scales up, the tools used in quality control also need to be scaled up. These tools must be fast to keep up with the production rate, while still maintaining high accuracy to meet product [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":3408,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,350],"tags":[319],"class_list":["post-3415","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-geometry-shape","tag-large-area-profilometry"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/3415","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/comments?post=3415"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/3415\/revisions"}],"predecessor-version":[{"id":3418,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/3415\/revisions\/3418"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/media\/3408"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/media?parent=3415"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/categories?post=3415"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/tags?post=3415"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}