{"id":3357,"date":"2018-03-29T13:49:55","date_gmt":"2018-03-29T13:49:55","guid":{"rendered":"https:\/\/nanovea.com\/?p=3357"},"modified":"2019-07-31T14:56:53","modified_gmt":"2019-07-31T14:56:53","slug":"pomiar-grubosci-powloki-wafla-przy-uzyciu-profilometrii-3d","status":"publish","type":"post","link":"https:\/\/nanovea.com\/pl\/wafer-coating-thickness-measurement-using-3d-profilometry\/","title":{"rendered":"Pomiar grubo\u015bci pow\u0142oki wafla za pomoc\u0105 profilometrii 3D"},"content":{"rendered":"<p>Pomiar grubo\u015bci pow\u0142ok na p\u0142ytkach krzemowych ma znaczenie krytyczne. Wafle krzemowe s\u0105 szeroko stosowane w produkcji uk\u0142ad\u00f3w scalonych i innych mikrourz\u0105dze\u0144 wykorzystywanych w wielu ga\u0142\u0119ziach przemys\u0142u. Sta\u0142e zapotrzebowanie na cie\u0144sze i g\u0142adsze p\u0142ytki i pow\u0142oki na p\u0142ytkach sprawia, \u017ce bezdotykowy Nanovea 3D <a href=\"https:\/\/nanovea.com\/profilometers\/\">Profilometr<\/a> jest doskona\u0142ym narz\u0119dziem do ilo\u015bciowej oceny grubo\u015bci pow\u0142oki i chropowato\u015bci niemal ka\u017cdej powierzchni. Pomiary w tym artykule zosta\u0142y wykonane na pr\u00f3bce pokrytego wafla w celu zademonstrowania mo\u017cliwo\u015bci naszego Profilometru Bezkontaktowego 3D.<\/p>\n<p><a href=\"http:\/\/nanovea.com\/App-Notes\/thinfilmthicknessmeasurement.pdf\">Pomiar grubo\u015bci pow\u0142oki wafla za pomoc\u0105 profilometrii 3D<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Wafer Coating Thickness Measurement is critical. Silicon wafers are widely used in the making of integrated circuits and other micro devices used in a vast number of industries. A constant demand for thinner and smoother wafers and wafer coatings makes the Nanovea 3D non-contact Profilometer a great tool to quantify coating thickness and roughness of [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":3360,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,352],"tags":[308],"class_list":["post-3357","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-step-height-thickness","tag-wafer-coating-thickness"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/3357","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/comments?post=3357"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/3357\/revisions"}],"predecessor-version":[{"id":6628,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/3357\/revisions\/6628"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/media\/3360"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/media?parent=3357"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/categories?post=3357"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/tags?post=3357"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}