{"id":2950,"date":"2017-09-01T21:32:31","date_gmt":"2017-09-01T21:32:31","guid":{"rendered":"http:\/\/nanovea.com\/?p=2950"},"modified":"2019-07-31T14:45:46","modified_gmt":"2019-07-31T14:45:46","slug":"profilometria-pomiar-plaskosci","status":"publish","type":"post","link":"https:\/\/nanovea.com\/pl\/flatness-measurement-screen-profilometry\/","title":{"rendered":"Pomiar p\u0142asko\u015bci ekranu za pomoc\u0105 szybkiej profilometrii 3D"},"content":{"rendered":"<p><a href=\"https:\/\/nanovea.com\/surface-flatness-measurement\/\">Pomiar p\u0142asko\u015bci<\/a> jest wa\u017cn\u0105 geometryczn\u0105 jako\u015bci\u0105 powierzchni w produkcji precyzyjnych cz\u0119\u015bci i zespo\u0142\u00f3w. P\u0142asko\u015b\u0107 powierzchni odgrywa istotn\u0105 rol\u0119 w ko\u0144cowym zastosowaniu produktu. Na przyk\u0142ad cz\u0119\u015bci, kt\u00f3re s\u0105 po\u0142\u0105czone w spos\u00f3b hermetyczny lub szczelny dla cieczy na ca\u0142ej powierzchni, wymagaj\u0105 rygorystycznych warunk\u00f3w powierzchniowych o doskona\u0142ej p\u0142asko\u015bci na powierzchni styku. P\u0142asko\u015b\u0107 ekranu ma kluczowe znaczenie dla funkcjonalno\u015bci i estetyki urz\u0105dze\u0144 elektronicznych, takich jak telefony kom\u00f3rkowe, tablety i laptopy. Wszelkie niedoskona\u0142o\u015bci p\u0142asko\u015bci ekranu mog\u0105 powodowa\u0107 negatywne wra\u017cenia u\u017cytkownika i do\u015bwiadczenia zwi\u0105zane z produktem.<\/p>\n<p>Zobacz <a href=\"https:\/\/youtu.be\/IjkGo8La2IU\">Klip wideo<\/a> lub Przeczytaj raport: <a href=\"https:\/\/nanovea.com\/App-Notes\/flatness-measurement.pdf\">Pomiar p\u0142asko\u015bci ekranu za pomoc\u0105 szybkiej profilometrii 3D<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Flatness measurement is an important geometric surface quality in the manufacture of precision parts and assemblies. Flatness of the surface plays a vital role in the end use of the product. For example, the parts that are connected in an air-tight or liquid-tight manner across a surface area require stringent surface conditions of superior flatness [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":2951,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,354],"tags":[297],"class_list":["post-2950","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-flatness-warpage","tag-fast-flatness-measurement"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/2950","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/comments?post=2950"}],"version-history":[{"count":2,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/2950\/revisions"}],"predecessor-version":[{"id":3137,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/2950\/revisions\/3137"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/media\/2951"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/media?parent=2950"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/categories?post=2950"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/tags?post=2950"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}