{"id":1243,"date":"2012-01-07T00:25:06","date_gmt":"2012-01-07T00:25:06","guid":{"rendered":"http:\/\/nanovea.com\/?p=1243"},"modified":"2015-06-18T16:35:41","modified_gmt":"2015-06-18T16:35:41","slug":"kontrola-stykow-z-profilometria-3d","status":"publish","type":"post","link":"https:\/\/nanovea.com\/pl\/connector-pin-inspection-with-3d-profilometry\/","title":{"rendered":"Kontrola pin\u00f3w z\u0142\u0105czy za pomoc\u0105 profilometrii 3D"},"content":{"rendered":"<p>W tym zastosowaniu, Nanovea ST400 <a title=\"profilometr\" href=\"https:\/\/nanovea.com\/profilometers\" target=\"_blank\">Profilometr<\/a> s\u0142u\u017cy do pomiaru pe\u0142nego obszaru powierzchni z\u0142\u0105cza i jego pin\u00f3w. Aplikacja zosta\u0142a wybrana ze wzgl\u0119du na jej wymagaj\u0105ce cechy, jednocze\u015bnie podkre\u015blaj\u0105c mo\u017cliwo\u015bci pomiarowe techniki Nanovea. Istnieje niesko\u0144czona lista parametr\u00f3w powierzchni, kt\u00f3re mog\u0105 by\u0107 automatycznie obliczane po skanowaniu powierzchni. Tutaj dokonamy przegl\u0105du pe\u0142nego profilu 3D, p\u0142asko\u015bci podstawy z\u0142\u0105cza, wsp\u00f3\u0142p\u0142aszczyznowo\u015bci pin\u00f3w i chropowato\u015bci ko\u0144c\u00f3wki pinu.<\/p>\n<p><a href=\"https:\/\/nanovea.com\/wp-content\/themes\/wp-nanovea\/Application%20Notes\/connector-pin-inspection.pdf\">Kontrola pin\u00f3w z\u0142\u0105czy za pomoc\u0105 profilometrii 3D<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>In this application, the Nanovea ST400 Profilometer is used to measure the full area of a connector surface and its pins. The application was chosen for its challenging features while highlighting the measurement options with Nanovea\u2019s technique. There is an endless list surface parameters that can be automatically calculated after the surface scan. Here we [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":1244,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7],"tags":[183],"class_list":["post-1243","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","tag-connector-pin"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/1243","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/comments?post=1243"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/1243\/revisions"}],"predecessor-version":[{"id":1801,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/1243\/revisions\/1801"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/media\/1244"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/media?parent=1243"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/categories?post=1243"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/tags?post=1243"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}