{"id":1066,"date":"2013-08-06T18:29:12","date_gmt":"2013-08-06T18:29:12","guid":{"rendered":"http:\/\/nanovea.com\/?p=1066"},"modified":"2015-06-17T17:00:55","modified_gmt":"2015-06-17T17:00:55","slug":"pomiar-powierzchni-wlokien-weglowych-za-pomoca-profilometrii-3d","status":"publish","type":"post","link":"https:\/\/nanovea.com\/pl\/carbon-fiber-surface-measurement-using-3d-profilometry\/","title":{"rendered":"Pomiar powierzchni przy u\u017cyciu profilometrii 3D"},"content":{"rendered":"<p>W tym zastosowaniu Nanovea ST400 <a title=\"profilometr\" href=\"https:\/\/nanovea.com\/profilometers\" target=\"_blank\">Profilomete<\/a>r s\u0142u\u017cy do pomiaru powierzchni ods\u0142oni\u0119tego kawa\u0142ka w\u0142\u00f3kna w\u0119glowego. Zmierzony obszar zosta\u0142 wybrany losowo i za\u0142o\u017cono, \u017ce jest wystarczaj\u0105co du\u017cy, aby mo\u017cna go by\u0142o ekstrapolowa\u0107 w celu przyj\u0119cia za\u0142o\u017ce\u0144 dotycz\u0105cych<br \/>\nznacznie wi\u0119ksz\u0105 powierzchni\u0119. Chropowato\u015b\u0107 powierzchni, pole powierzchni, d\u0142ugo\u015b\u0107 fali, analiza fraktalna i inne parametry powierzchni s\u0105 wykorzystywane do scharakteryzowania powierzchni.<\/p>\n<p><a href=\"https:\/\/nanovea.com\/wp-content\/themes\/wp-nanovea\/Application%20Notes\/carbon-fiber-measurement.pdf\">Pomiar powierzchni przy u\u017cyciu profilometrii 3D<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>In this application the Nanovea ST400 Profilometer is used for surface measurement of an exposed piece of carbon fiber. The area measured was selected at random, and assumed large enough in that it could be extrapolated to make assumptions about a much larger surface. Surface roughness, surface area, wavelength, fractal analysis and other surface parameters [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":1067,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7],"tags":[155],"class_list":["post-1066","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","tag-surface-measurement"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/1066","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/comments?post=1066"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/1066\/revisions"}],"predecessor-version":[{"id":1741,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/posts\/1066\/revisions\/1741"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/media\/1067"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/media?parent=1066"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/categories?post=1066"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/pl\/wp-json\/wp\/v2\/tags?post=1066"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}