{"id":1052,"date":"2013-09-05T16:28:05","date_gmt":"2013-09-05T16:28:05","guid":{"rendered":"http:\/\/nanovea.com\/?p=1052"},"modified":"2019-07-31T14:45:04","modified_gmt":"2019-07-31T14:45:04","slug":"wafer-array-flatness-measurement-using-3d-profilometry","status":"publish","type":"post","link":"https:\/\/nanovea.com\/it\/wafer-array-flatness-measurement-using-3d-profilometry\/","title":{"rendered":"Misura della planarit\u00e0 del wafer mediante profilometria 3D"},"content":{"rendered":"<p>In questa applicazione il Nanovea ST400 <a title=\"profilometro\" href=\"https:\/\/nanovea.com\/profilometers\" target=\"_blank\" rel=\"noopener noreferrer\">Profilometro<\/a> viene utilizzato per misurare la sezione di un array di wafer. L'area misurata \u00e8 stata scelta a caso e si presume che sia sufficientemente grande da poter essere estrapolata per fare ipotesi su una superficie molto pi\u00f9 ampia. Superficie <a title=\"misura della planarit\u00e0\" href=\"https:\/\/nanovea.com\/surface-flatness-measurement\" target=\"_blank\" rel=\"noopener noreferrer\">misura della planarit\u00e0<\/a>Per analizzare la superficie vengono utilizzati i parametri di planarit\u00e0 e altri parametri di superficie.<\/p>\n<p><a href=\"https:\/\/nanovea.com\/wp-content\/themes\/wp-nanovea\/Application%20Notes\/wafer-array-flatness.pdf\"><br \/>\nMisura della planarit\u00e0 del wafer mediante profilometria 3D<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>In this application the Nanovea ST400 Profilometer is used to measure the section of a wafer array. The area measured was selected at random, and assumed large enough in that it could be extrapolated to make assumptions about a much larger surface. Surface flatness measurement, planarity &amp; other surface parameters are used to analyze the [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":1053,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,354],"tags":[153],"class_list":["post-1052","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-flatness-warpage","tag-flatness-measurement"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/it\/wp-json\/wp\/v2\/posts\/1052","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/it\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/it\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/it\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/it\/wp-json\/wp\/v2\/comments?post=1052"}],"version-history":[{"count":4,"href":"https:\/\/nanovea.com\/it\/wp-json\/wp\/v2\/posts\/1052\/revisions"}],"predecessor-version":[{"id":6629,"href":"https:\/\/nanovea.com\/it\/wp-json\/wp\/v2\/posts\/1052\/revisions\/6629"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/it\/wp-json\/wp\/v2\/media\/1053"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/it\/wp-json\/wp\/v2\/media?parent=1052"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/it\/wp-json\/wp\/v2\/categories?post=1052"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/it\/wp-json\/wp\/v2\/tags?post=1052"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}