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PROFILOMETERS


NANOVEA Profilometers are designed with leading edge Chromatic Confocal optical technology (Axial Chromatism).

  • The technique measures a physical wavelength directly related to a specific height without using any complex algorithms. This ensures accurate results for all surface conditions; unlike all other techniques.
  • Fast speed sensors are available to scan large surface at high accuracy.
  • Nanovea range of 3D Non Contact Profilometers include small compact PS-50 to Large Pneumatic HS2000 and the first fully portable Profilometer, the Jr-25.





MODELS


ST500 Profilometer
Large Area



Jr25 Profilometer
Portable



PS50 Profilometer
Compact



ST400 Profilometer
Standard



AFMPRO Profilometer
Atomic Force



JR100 Profilometer
Portable



HS2000 Profilometer
Zero Noise/Flatness



In-line Profilometer
Roughness QC




Featured Applications


Quality Analysis on Electrical Discharge Machined Metals
Electrical discharge machining, or EDM, is a manufacturing process that removes material via electrical discharges [1]. This machining process is generally...



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A Better Look at Paper
Paper has played a large role in information distribution since its invention in the 2nd century [1]. Paper consists of intertwined fibers, typically obtained...



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A BETTER Look at Polycarbonate Lens
Polycarbonate lenses are commonly used in many optical applications. Their high impact resistance, low weight, and cheap cost of high-volume production...



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