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PROFILOMETERS


NANOVEA Profilometers are designed with leading edge Chromatic Confocal optical technology (Axial Chromatism).

  • The technique measures a physical wavelength directly related to a specific height without using any complex algorithms. This ensures accurate results for all surface conditions; unlike all other techniques.
  • Fast speed sensors are available to scan large surface at high accuracy.
  • Nanovea range of 3D Non Contact Profilometers include small compact PS-50 to Large Pneumatic HS2000 and the first fully portable Profilometer, the Jr-25.





MODELS



ST500 Profilometer
Large Area



Jr25 Profilometer
Portable



PS50 Profilometer
Compact



ST400 Profilometer
Standard



AFMPRO Profilometer
Atomic Force



JR100 Profilometer
Portable



HS2000 Profilometer
Zero Noise/Flatness



In-line Profilometer
Roughness QC











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