{"id":3415,"date":"2018-07-30T19:27:21","date_gmt":"2018-07-30T19:27:21","guid":{"rendered":"https:\/\/nanovea.com\/?p=3415"},"modified":"2019-07-31T14:47:43","modified_gmt":"2019-07-31T14:47:43","slug":"pcb-profilometrie-grande-zone-automatisee","status":"publish","type":"post","link":"https:\/\/nanovea.com\/fr\/automated-large-area-profilometry-pcb\/","title":{"rendered":"Profilom\u00e9trie automatis\u00e9e de grande surface de PCB"},"content":{"rendered":"<p>La mise \u00e0 l'\u00e9chelle des processus de fabrication est n\u00e9cessaire pour que les industries se d\u00e9veloppent et r\u00e9pondent \u00e0 des demandes en constante augmentation. Les outils utilis\u00e9s pour le contr\u00f4le de la qualit\u00e9 doivent \u00e9galement \u00eatre adapt\u00e9s \u00e0 l'\u00e9volution des processus de fabrication. Ces outils doivent \u00eatre rapides pour suivre le rythme de production, tout en maintenant une grande pr\u00e9cision pour respecter les limites de tol\u00e9rance des produits. Ici, le Nanovea HS2000 <a href=\"https:\/\/nanovea.com\/profilometers\/\">Profilom\u00e8tre,\u00a0<\/a>avec Line Sensor, d\u00e9montre sa valeur en tant qu'instrument de contr\u00f4le de la qualit\u00e9 gr\u00e2ce \u00e0 ses capacit\u00e9s de profilom\u00e9trie rapide, automatis\u00e9e et \u00e0 haute r\u00e9solution sur de grandes surfaces.<\/p>\n<p><a href=\"https:\/\/www.youtube.com\/watch?v=9NuPHYFr5IY\">Clip vid\u00e9o<\/a> ou App Note : <a href=\"http:\/\/nanovea.com\/\/App-Notes\/pcb-topography.pdf\">Profilom\u00e9trie automatis\u00e9e de grande surface de PCB<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Scaling up of manufacturing processes is necessary for industries to grow and keep up with constantly increasing demands. As manufacturing process scales up, the tools used in quality control also need to be scaled up. These tools must be fast to keep up with the production rate, while still maintaining high accuracy to meet product [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":3408,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,350],"tags":[319],"class_list":["post-3415","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-geometry-shape","tag-large-area-profilometry"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/posts\/3415","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/comments?post=3415"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/posts\/3415\/revisions"}],"predecessor-version":[{"id":3418,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/posts\/3415\/revisions\/3418"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/media\/3408"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/media?parent=3415"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/categories?post=3415"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/tags?post=3415"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}