{"id":3357,"date":"2018-03-29T13:49:55","date_gmt":"2018-03-29T13:49:55","guid":{"rendered":"https:\/\/nanovea.com\/?p=3357"},"modified":"2019-07-31T14:56:53","modified_gmt":"2019-07-31T14:56:53","slug":"mesure-de-lepaisseur-du-revetement-des-plaquettes-a-laide-de-la-profilometrie-3d","status":"publish","type":"post","link":"https:\/\/nanovea.com\/fr\/wafer-coating-thickness-measurement-using-3d-profilometry\/","title":{"rendered":"Mesure de l'\u00e9paisseur du rev\u00eatement d'un wafer \u00e0 l'aide de la profilom\u00e9trie 3D"},"content":{"rendered":"<p>La mesure de l'\u00e9paisseur du rev\u00eatement des plaquettes est essentielle. Les tranches de silicium sont largement utilis\u00e9es dans la fabrication de circuits int\u00e9gr\u00e9s et d'autres micro-dispositifs utilis\u00e9s dans un grand nombre d'industries. La demande constante de wafers et de rev\u00eatements de wafers plus fins et plus lisses rend le Nanovea 3D sans contact <a href=\"https:\/\/nanovea.com\/profilometers\/\">Profilom\u00e8tre<\/a> un outil formidable pour quantifier l'\u00e9paisseur du rev\u00eatement et la rugosit\u00e9 de n'importe quelle surface. Les mesures pr\u00e9sent\u00e9es dans cet article ont \u00e9t\u00e9 prises sur un \u00e9chantillon de plaquette rev\u00eatue afin de d\u00e9montrer les capacit\u00e9s de notre profilom\u00e8tre 3D sans contact.<\/p>\n<p><a href=\"http:\/\/nanovea.com\/App-Notes\/thinfilmthicknessmeasurement.pdf\">Mesure de l'\u00e9paisseur du rev\u00eatement d'un wafer \u00e0 l'aide de la profilom\u00e9trie 3D<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Wafer Coating Thickness Measurement is critical. Silicon wafers are widely used in the making of integrated circuits and other micro devices used in a vast number of industries. A constant demand for thinner and smoother wafers and wafer coatings makes the Nanovea 3D non-contact Profilometer a great tool to quantify coating thickness and roughness of [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":3360,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,352],"tags":[308],"class_list":["post-3357","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-step-height-thickness","tag-wafer-coating-thickness"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/posts\/3357","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/comments?post=3357"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/posts\/3357\/revisions"}],"predecessor-version":[{"id":6628,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/posts\/3357\/revisions\/6628"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/media\/3360"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/media?parent=3357"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/categories?post=3357"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/fr\/wp-json\/wp\/v2\/tags?post=3357"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}