{"version":"1.0","provider_name":"NANOVEA : Profilom\u00e8tres, tribom\u00e8tres, nanoindeurs et testeurs de rayures avanc\u00e9s pour les essais de mat\u00e9riaux","provider_url":"https:\/\/nanovea.com\/fr","title":"Conchology Topography Measurement Using 3D Profilometry - NANOVEA: Advanced Profilometers, Tribometers, Nanoindenters, and Scratch Testers for Materials Testing","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"ashTQtI55W\"><a href=\"https:\/\/nanovea.com\/fr\/conchology-topography-measurement\/\">Mesure de la topographie de la conchologie \u00e0 l'aide de la profilom\u00e9trie 3D<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/nanovea.com\/fr\/conchology-topography-measurement\/embed\/#?secret=ashTQtI55W\" width=\"600\" height=\"338\" title=\"\u00ab\u00a0Conchology  Topography  Measurement  Using 3D Profilometry\u00a0\u00bb &#8212; NANOVEA: Advanced Profilometers, Tribometers, Nanoindenters, and Scratch Testers for Materials Testing\" data-secret=\"ashTQtI55W\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>","thumbnail_url":"https:\/\/nanovea.com\/wp-content\/uploads\/2018\/06\/conchology-topography-measurement.jpg","thumbnail_width":603,"thumbnail_height":294,"description":"Conchology topography, by scanning the whole surface of an oyster shell, the Nanovea HS2000 Profilometer Line Sensor will display its ability to work with large samples with abnormal geometries. Reflectivity, transparency, and angles do not affect the data collected with our technology, making 3D Non-Contact Profilometry ideal for all types of samples."}