{"id":3415,"date":"2018-07-30T19:27:21","date_gmt":"2018-07-30T19:27:21","guid":{"rendered":"https:\/\/nanovea.com\/?p=3415"},"modified":"2019-07-31T14:47:43","modified_gmt":"2019-07-31T14:47:43","slug":"automated-large-area-profilometry-pcb","status":"publish","type":"post","link":"https:\/\/nanovea.com\/es\/automated-large-area-profilometry-pcb\/","title":{"rendered":"Perfilometr\u00eda automatizada de grandes superficies de PCB"},"content":{"rendered":"<p>La ampliaci\u00f3n de los procesos de fabricaci\u00f3n es necesaria para que las industrias crezcan y se mantengan al d\u00eda con las demandas en constante aumento. A medida que se ampl\u00edan los procesos de fabricaci\u00f3n, tambi\u00e9n es necesario ampliar las herramientas utilizadas en el control de calidad. Estas herramientas deben ser r\u00e1pidas para mantenerse al d\u00eda con la tasa de producci\u00f3n, al tiempo que mantienen una alta precisi\u00f3n para cumplir con los l\u00edmites de tolerancia del producto. Aqu\u00ed, el Nanovea HS2000 <a href=\"https:\/\/nanovea.com\/profilometers\/\">Perfil\u00f3metro,\u00a0<\/a>con sensor de l\u00ednea, demuestra su valor como instrumento de control de calidad gracias a sus capacidades de perfilometr\u00eda de gran superficie, r\u00e1pidas, automatizadas y de alta resoluci\u00f3n.<\/p>\n<p><a href=\"https:\/\/www.youtube.com\/watch?v=9NuPHYFr5IY\">V\u00eddeo<\/a> o Nota de aplicaci\u00f3n: <a href=\"http:\/\/nanovea.com\/\/App-Notes\/pcb-topography.pdf\">Perfilometr\u00eda automatizada de grandes superficies de PCB<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Scaling up of manufacturing processes is necessary for industries to grow and keep up with constantly increasing demands. As manufacturing process scales up, the tools used in quality control also need to be scaled up. These tools must be fast to keep up with the production rate, while still maintaining high accuracy to meet product [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":3408,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,350],"tags":[319],"class_list":["post-3415","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-geometry-shape","tag-large-area-profilometry"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts\/3415","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/comments?post=3415"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts\/3415\/revisions"}],"predecessor-version":[{"id":3418,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts\/3415\/revisions\/3418"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/media\/3408"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/media?parent=3415"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/categories?post=3415"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/tags?post=3415"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}