{"id":3357,"date":"2018-03-29T13:49:55","date_gmt":"2018-03-29T13:49:55","guid":{"rendered":"https:\/\/nanovea.com\/?p=3357"},"modified":"2019-07-31T14:56:53","modified_gmt":"2019-07-31T14:56:53","slug":"medicion-del-espesor-del-revestimiento-de-las-obleas-mediante-perfilometria-3d","status":"publish","type":"post","link":"https:\/\/nanovea.com\/es\/wafer-coating-thickness-measurement-using-3d-profilometry\/","title":{"rendered":"Medici\u00f3n del espesor del recubrimiento de obleas mediante perfilometr\u00eda 3D"},"content":{"rendered":"<p>La medici\u00f3n del espesor del recubrimiento de las obleas es fundamental. Las obleas de silicio se utilizan ampliamente en la fabricaci\u00f3n de circuitos integrados y otros microdispositivos utilizados en un gran n\u00famero de industrias. La demanda constante de obleas y recubrimientos m\u00e1s finos y lisos hace que el Nanovea 3D sin contacto <a href=\"https:\/\/nanovea.com\/profilometers\/\">Perfil\u00f3metro<\/a> Una excelente herramienta para cuantificar el espesor y la rugosidad del recubrimiento de pr\u00e1cticamente cualquier superficie. Las mediciones de este art\u00edculo se tomaron de una muestra de oblea recubierta con el fin de demostrar las capacidades de nuestro perfil\u00f3metro 3D sin contacto.<\/p>\n<p><a href=\"http:\/\/nanovea.com\/App-Notes\/thinfilmthicknessmeasurement.pdf\">Medici\u00f3n del espesor del recubrimiento de obleas mediante perfilometr\u00eda 3D<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Wafer Coating Thickness Measurement is critical. Silicon wafers are widely used in the making of integrated circuits and other micro devices used in a vast number of industries. A constant demand for thinner and smoother wafers and wafer coatings makes the Nanovea 3D non-contact Profilometer a great tool to quantify coating thickness and roughness of [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":3360,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,352],"tags":[308],"class_list":["post-3357","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-step-height-thickness","tag-wafer-coating-thickness"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts\/3357","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/comments?post=3357"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts\/3357\/revisions"}],"predecessor-version":[{"id":6628,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts\/3357\/revisions\/6628"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/media\/3360"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/media?parent=3357"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/categories?post=3357"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/tags?post=3357"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}