{"id":2950,"date":"2017-09-01T21:32:31","date_gmt":"2017-09-01T21:32:31","guid":{"rendered":"http:\/\/nanovea.com\/?p=2950"},"modified":"2019-07-31T14:45:46","modified_gmt":"2019-07-31T14:45:46","slug":"perfilometria-de-pantalla-de-medicion-de-planitud","status":"publish","type":"post","link":"https:\/\/nanovea.com\/es\/flatness-measurement-screen-profilometry\/","title":{"rendered":"Medici\u00f3n de la planitud de la pantalla mediante perfilometr\u00eda 3D r\u00e1pida"},"content":{"rendered":"<p><a href=\"https:\/\/nanovea.com\/surface-flatness-measurement\/\">Medici\u00f3n de la planitud<\/a> es una cualidad geom\u00e9trica importante de la superficie en la fabricaci\u00f3n de piezas y ensamblajes de precisi\u00f3n. La planitud de la superficie desempe\u00f1a un papel fundamental en el uso final del producto. Por ejemplo, las piezas que se conectan de manera herm\u00e9tica al aire o a los l\u00edquidos a trav\u00e9s de una superficie requieren condiciones estrictas de planitud superior en la cara de contacto. La planitud de la pantalla es fundamental para la funcionalidad y la est\u00e9tica de los dispositivos electr\u00f3nicos, como tel\u00e9fonos celulares, tabletas y computadoras port\u00e1tiles. Cualquier imperfecci\u00f3n en la planitud de la pantalla puede crear una impresi\u00f3n y una experiencia negativas para el usuario del producto.<\/p>\n<p>Ver <a href=\"https:\/\/youtu.be\/IjkGo8La2IU\">V\u00eddeo<\/a> o Leer informe: <a href=\"https:\/\/nanovea.com\/App-Notes\/flatness-measurement.pdf\">Medici\u00f3n de la planitud de la pantalla mediante perfilometr\u00eda 3D r\u00e1pida<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Flatness measurement is an important geometric surface quality in the manufacture of precision parts and assemblies. Flatness of the surface plays a vital role in the end use of the product. For example, the parts that are connected in an air-tight or liquid-tight manner across a surface area require stringent surface conditions of superior flatness [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":2951,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,354],"tags":[297],"class_list":["post-2950","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-flatness-warpage","tag-fast-flatness-measurement"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts\/2950","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/comments?post=2950"}],"version-history":[{"count":2,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts\/2950\/revisions"}],"predecessor-version":[{"id":3137,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts\/2950\/revisions\/3137"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/media\/2951"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/media?parent=2950"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/categories?post=2950"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/tags?post=2950"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}