{"id":1243,"date":"2012-01-07T00:25:06","date_gmt":"2012-01-07T00:25:06","guid":{"rendered":"http:\/\/nanovea.com\/?p=1243"},"modified":"2015-06-18T16:35:41","modified_gmt":"2015-06-18T16:35:41","slug":"inspeccion-de-clavijas-de-conectores-con-perfilometria-3d","status":"publish","type":"post","link":"https:\/\/nanovea.com\/es\/connector-pin-inspection-with-3d-profilometry\/","title":{"rendered":"Inspecci\u00f3n de pines de conectores con perfilometr\u00eda 3D"},"content":{"rendered":"<p>En esta aplicaci\u00f3n, el Nanovea ST400 <a title=\"perfil\u00f3metro\" href=\"https:\/\/nanovea.com\/profilometers\" target=\"_blank\">Perfil\u00f3metro<\/a> se utiliza para medir toda la superficie de un conector y sus pines. La aplicaci\u00f3n se eligi\u00f3 por sus caracter\u00edsticas desafiantes, al tiempo que se resaltaban las opciones de medici\u00f3n con la t\u00e9cnica de Nanovea. Hay una lista interminable de par\u00e1metros de superficie que se pueden calcular autom\u00e1ticamente despu\u00e9s del escaneo de la superficie. Aqu\u00ed revisaremos un perfil 3D completo, la planitud de la base del conector, la coplanaridad de los pines y la rugosidad de la punta de un pin.<\/p>\n<p><a href=\"https:\/\/nanovea.com\/wp-content\/themes\/wp-nanovea\/Application%20Notes\/connector-pin-inspection.pdf\">Inspecci\u00f3n de pines de conectores con perfilometr\u00eda 3D<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>In this application, the Nanovea ST400 Profilometer is used to measure the full area of a connector surface and its pins. The application was chosen for its challenging features while highlighting the measurement options with Nanovea\u2019s technique. There is an endless list surface parameters that can be automatically calculated after the surface scan. Here we [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":1244,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7],"tags":[183],"class_list":["post-1243","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","tag-connector-pin"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts\/1243","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/comments?post=1243"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts\/1243\/revisions"}],"predecessor-version":[{"id":1801,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/posts\/1243\/revisions\/1801"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/media\/1244"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/media?parent=1243"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/categories?post=1243"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/es\/wp-json\/wp\/v2\/tags?post=1243"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}