{"id":7045,"date":"2019-10-17T14:36:14","date_gmt":"2019-10-17T14:36:14","guid":{"rendered":"https:\/\/nanovea.com\/?p=7045"},"modified":"2023-11-08T23:26:20","modified_gmt":"2023-11-08T23:26:20","slug":"hochgeschwindigkeits-scanning-und-beruhrungslose-profilometrie","status":"publish","type":"post","link":"https:\/\/nanovea.com\/de\/hochgeschwindigkeits-scanning-und-beruhrungslose-profilometrie\/","title":{"rendered":"Hochgeschwindigkeits-Scannen mit ber\u00fchrungsloser Profilometrie"},"content":{"rendered":"<p><strong>Einleitung:<\/strong><\/p>\n<p>Schnell und einfach einzurichtende Oberfl\u00e4chenmessungen sparen Zeit und Aufwand und sind f\u00fcr die Qualit\u00e4tskontrolle, Forschung und Entwicklung sowie Produktionsanlagen unerl\u00e4sslich. Der Nanovea <a href=\"https:\/\/nanovea.com\/profilometers\/\">Ber\u00fchrungsloses Profilometer<\/a> ist in der Lage, sowohl 3D- als auch 2D-Oberfl\u00e4chenscans durchzuf\u00fchren, um Merkmale im Nano- bis Makroma\u00dfstab auf jeder Oberfl\u00e4che zu messen und bietet so eine breite Einsatzm\u00f6glichkeit.<\/p>\n<p><a href=\"http:\/\/nanovea.com\/App-Notes\/High-Speed-Scanning-with-Non-contact-profilometry.pdf\"><img fetchpriority=\"high\" decoding=\"async\" class=\"alignnone wp-image-7073\" src=\"https:\/\/nanovea.com\/wp-content\/uploads\/2019\/10\/cover-for-prof-actual-fixed.jpg\" alt=\"\" width=\"589\" height=\"677\" \/><\/a><\/p>\n<p><a href=\"http:\/\/nanovea.com\/App-Notes\/High-Speed-Scanning-with-Non-contact-profilometry.pdf\">Zum Lesen hier klicken!<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Introduction: Quick and easy set-up surface measurements save time, effort and are essential for quality control, research and development and production facilities. The Nanovea Non-Contact Profilometer is capable of performing both 3D &amp; 2D surface scans to measure nano to macro scale features on any surface, providing broad range usability. Click here to read!<\/p>","protected":false},"author":1,"featured_media":7084,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,349,350,351,335],"tags":[],"class_list":["post-7045","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-laboratory-testing","category-profilometry-geometry-shape","category-profilometry-roughness-finish","category-profilometry-testing"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/7045","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/comments?post=7045"}],"version-history":[{"count":7,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/7045\/revisions"}],"predecessor-version":[{"id":23356,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/7045\/revisions\/23356"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/media\/7084"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/media?parent=7045"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/categories?post=7045"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/tags?post=7045"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}