{"id":3415,"date":"2018-07-30T19:27:21","date_gmt":"2018-07-30T19:27:21","guid":{"rendered":"https:\/\/nanovea.com\/?p=3415"},"modified":"2019-07-31T14:47:43","modified_gmt":"2019-07-31T14:47:43","slug":"automatisierte-grosflachige-profilometrie-pcb","status":"publish","type":"post","link":"https:\/\/nanovea.com\/de\/automated-large-area-profilometry-pcb\/","title":{"rendered":"Automatisierte gro\u00dffl\u00e4chige Profilometrie von PCB"},"content":{"rendered":"<p>Die Skalierung von Fertigungsprozessen ist notwendig, damit die Industrie wachsen und mit der st\u00e4ndig steigenden Nachfrage Schritt halten kann. Mit der Skalierung des Fertigungsprozesses m\u00fcssen auch die f\u00fcr die Qualit\u00e4tskontrolle verwendeten Werkzeuge skaliert werden. Diese Werkzeuge m\u00fcssen schnell sein, um mit der Produktionsrate mithalten zu k\u00f6nnen, und gleichzeitig eine hohe Genauigkeit aufweisen, um die Produkttoleranzgrenzen einzuhalten. Hier wird das Nanovea HS2000 <a href=\"https:\/\/nanovea.com\/profilometers\/\">Profilometer,\u00a0<\/a>mit Zeilensensor, zeigt seinen Wert als Qualit\u00e4tskontrollinstrument mit seinen schnellen, automatisierten und hochaufl\u00f6senden gro\u00dffl\u00e4chigen Profilometriefunktionen.<\/p>\n<p><a href=\"https:\/\/www.youtube.com\/watch?v=9NuPHYFr5IY\">Videoclip<\/a> oder App Note: <a href=\"http:\/\/nanovea.com\/\/App-Notes\/pcb-topography.pdf\">Automatisierte gro\u00dffl\u00e4chige Profilometrie von PCB<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Scaling up of manufacturing processes is necessary for industries to grow and keep up with constantly increasing demands. As manufacturing process scales up, the tools used in quality control also need to be scaled up. These tools must be fast to keep up with the production rate, while still maintaining high accuracy to meet product [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":3408,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,350],"tags":[319],"class_list":["post-3415","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-geometry-shape","tag-large-area-profilometry"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/3415","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/comments?post=3415"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/3415\/revisions"}],"predecessor-version":[{"id":3418,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/3415\/revisions\/3418"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/media\/3408"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/media?parent=3415"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/categories?post=3415"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/tags?post=3415"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}