{"id":3357,"date":"2018-03-29T13:49:55","date_gmt":"2018-03-29T13:49:55","guid":{"rendered":"https:\/\/nanovea.com\/?p=3357"},"modified":"2019-07-31T14:56:53","modified_gmt":"2019-07-31T14:56:53","slug":"wafer-beschichtung-dickenmessung-mit-3d-profilometrie","status":"publish","type":"post","link":"https:\/\/nanovea.com\/de\/wafer-coating-thickness-measurement-using-3d-profilometry\/","title":{"rendered":"Wafer-Beschichtungsdickenmessung mit 3D-Profilometrie"},"content":{"rendered":"<p>Die Messung der Wafer-Beschichtungsdicke ist entscheidend. Silizium-Wafer werden in gro\u00dfem Umfang f\u00fcr die Herstellung von integrierten Schaltkreisen und anderen Mikrobauteilen verwendet, die in einer Vielzahl von Branchen zum Einsatz kommen. Die st\u00e4ndige Nachfrage nach d\u00fcnneren und glatteren Wafern und Waferbeschichtungen macht das ber\u00fchrungslose Nanovea 3D <a href=\"https:\/\/nanovea.com\/profilometers\/\">Profilometer<\/a> ein gro\u00dfartiges Werkzeug zur Quantifizierung der Schichtdicke und Rauheit von nahezu jeder Oberfl\u00e4che. Die Messungen in diesem Artikel wurden an einer beschichteten Waferprobe vorgenommen, um die F\u00e4higkeiten unseres ber\u00fchrungslosen 3D-Profilometers zu demonstrieren.<\/p>\n<p><a href=\"http:\/\/nanovea.com\/App-Notes\/thinfilmthicknessmeasurement.pdf\">Wafer-Beschichtungsdickenmessung mit 3D-Profilometrie<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Wafer Coating Thickness Measurement is critical. Silicon wafers are widely used in the making of integrated circuits and other micro devices used in a vast number of industries. A constant demand for thinner and smoother wafers and wafer coatings makes the Nanovea 3D non-contact Profilometer a great tool to quantify coating thickness and roughness of [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":3360,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,352],"tags":[308],"class_list":["post-3357","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-step-height-thickness","tag-wafer-coating-thickness"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/3357","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/comments?post=3357"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/3357\/revisions"}],"predecessor-version":[{"id":6628,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/3357\/revisions\/6628"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/media\/3360"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/media?parent=3357"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/categories?post=3357"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/tags?post=3357"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}