{"id":2950,"date":"2017-09-01T21:32:31","date_gmt":"2017-09-01T21:32:31","guid":{"rendered":"http:\/\/nanovea.com\/?p=2950"},"modified":"2019-07-31T14:45:46","modified_gmt":"2019-07-31T14:45:46","slug":"ebenheitsmessung-siebdruck-profilometrie","status":"publish","type":"post","link":"https:\/\/nanovea.com\/de\/flatness-measurement-screen-profilometry\/","title":{"rendered":"Ebenheitsmessung von Bildschirmen mit schneller 3D-Profilometrie"},"content":{"rendered":"<p><a href=\"https:\/\/nanovea.com\/surface-flatness-measurement\/\">Messung der Ebenheit<\/a> ist eine wichtige geometrische Oberfl\u00e4chenqualit\u00e4t bei der Herstellung von Pr\u00e4zisionsteilen und -baugruppen. Die Ebenheit der Oberfl\u00e4che spielt eine entscheidende Rolle f\u00fcr die Endverwendung des Produkts. So erfordern beispielsweise Teile, die \u00fcber eine Fl\u00e4che luft- oder fl\u00fcssigkeitsdicht verbunden sind, strenge Oberfl\u00e4chenbedingungen mit hervorragender Ebenheit an der Kontaktfl\u00e4che. Die Ebenheit des Bildschirms ist entscheidend f\u00fcr die Funktionalit\u00e4t und \u00c4sthetik elektronischer Ger\u00e4te wie Handys, Pads und Laptops. Jede Unregelm\u00e4\u00dfigkeit in der Ebenheit des Bildschirms kann den Eindruck und die Erfahrung des Benutzers mit dem Produkt negativ beeinflussen.<\/p>\n<p>Siehe <a href=\"https:\/\/youtu.be\/IjkGo8La2IU\">Videoclip<\/a> oder Bericht lesen: <a href=\"https:\/\/nanovea.com\/App-Notes\/flatness-measurement.pdf\">Ebenheitsmessung von Bildschirmen mit schneller 3D-Profilometrie<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>Flatness measurement is an important geometric surface quality in the manufacture of precision parts and assemblies. Flatness of the surface plays a vital role in the end use of the product. For example, the parts that are connected in an air-tight or liquid-tight manner across a surface area require stringent surface conditions of superior flatness [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":2951,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7,354],"tags":[297],"class_list":["post-2950","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","category-profilometry-flatness-warpage","tag-fast-flatness-measurement"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/2950","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/comments?post=2950"}],"version-history":[{"count":2,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/2950\/revisions"}],"predecessor-version":[{"id":3137,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/2950\/revisions\/3137"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/media\/2951"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/media?parent=2950"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/categories?post=2950"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/tags?post=2950"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}