{"id":1243,"date":"2012-01-07T00:25:06","date_gmt":"2012-01-07T00:25:06","guid":{"rendered":"http:\/\/nanovea.com\/?p=1243"},"modified":"2015-06-18T16:35:41","modified_gmt":"2015-06-18T16:35:41","slug":"stecker-stift-inspektion-mit-3d-profilometrie","status":"publish","type":"post","link":"https:\/\/nanovea.com\/de\/connector-pin-inspection-with-3d-profilometry\/","title":{"rendered":"Inspektion von Steckerstiften mit 3D-Profilometrie"},"content":{"rendered":"<p>Bei dieser Anwendung wird das Nanovea ST400 <a title=\"profilometer\" href=\"https:\/\/nanovea.com\/profilometers\" target=\"_blank\">Profilometer<\/a> wird zur Messung der gesamten Fl\u00e4che eines Steckverbinders und seiner Stifte verwendet. Die Anwendung wurde aufgrund ihrer anspruchsvollen Eigenschaften ausgew\u00e4hlt, um die Messm\u00f6glichkeiten mit der Nanovea-Technik zu verdeutlichen. Es gibt eine endlose Liste von Oberfl\u00e4chenparametern, die nach dem Oberfl\u00e4chenscan automatisch berechnet werden k\u00f6nnen. Hier werden wir ein vollst\u00e4ndiges 3D-Profil, die Ebenheit der Steckerbasis, die Koplanarit\u00e4t der Stifte und die Rauheit einer Stiftspitze untersuchen.<\/p>\n<p><a href=\"https:\/\/nanovea.com\/wp-content\/themes\/wp-nanovea\/Application%20Notes\/connector-pin-inspection.pdf\">Inspektion von Steckerstiften mit 3D-Profilometrie<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>In this application, the Nanovea ST400 Profilometer is used to measure the full area of a connector surface and its pins. The application was chosen for its challenging features while highlighting the measurement options with Nanovea\u2019s technique. There is an endless list surface parameters that can be automatically calculated after the surface scan. Here we [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":1244,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7],"tags":[183],"class_list":["post-1243","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","tag-connector-pin"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/1243","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/comments?post=1243"}],"version-history":[{"count":3,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/1243\/revisions"}],"predecessor-version":[{"id":1801,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/1243\/revisions\/1801"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/media\/1244"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/media?parent=1243"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/categories?post=1243"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/tags?post=1243"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}