{"id":1140,"date":"2012-11-06T20:09:56","date_gmt":"2012-11-06T20:09:56","guid":{"rendered":"http:\/\/nanovea.com\/?p=1140"},"modified":"2023-06-15T15:01:27","modified_gmt":"2023-06-15T15:01:27","slug":"statistische-analyse-der-oberflachenrauhigkeit-mit-3d-profilometrie","status":"publish","type":"post","link":"https:\/\/nanovea.com\/de\/surface-roughness-statistical-analysis-using-3d-profilometry\/","title":{"rendered":"Statistische Analyse der Oberfl\u00e4chenrauheit mit 3D-Profilometrie"},"content":{"rendered":"<p>In dieser Anwendung wird das Nanovea ST400 <a title=\"profilometer\" href=\"https:\/\/nanovea.com\/profilometers\" target=\"_blank\" rel=\"noopener\">Profilometer<\/a> wird zur Messung von \u00fcber 30 Coupons mit \u00e4hnlichen Oberfl\u00e4chenmerkmalen mit nur geringen Unterschieden verwendet. Die Oberfl\u00e4chen wurden auf folgende Parameter untersucht <a title=\"Oberfl\u00e4chenrauhigkeit\" href=\"https:\/\/nanovea.com\/surface-roughness-measurement\" target=\"_blank\" rel=\"noopener\">Oberfl\u00e4chenrauhigkeit<\/a>, maximale H\u00f6he, maximale Peakh\u00f6he und Wurzel aus dem Quadrat. Anschlie\u00dfend wurde eine statistische Analyse anhand von Histogrammen, Tabellen, Kontrollkarten, Boxplots und<br \/>\nStreudiagramme.<\/p>\n<p><a href=\"https:\/\/nanovea.com\/wp-content\/themes\/wp-nanovea\/Application%20Notes\/roughness-statistical-analysis.pdf\">Statistische Analyse der Oberfl\u00e4chenrauheit mit 3D-Profilometrie<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>In this application the Nanovea ST400 Profilometer is used to measure over 30 coupons with similar surface features with only slight differences. The surfaces were analyzed for parameters such as surface roughness, maximum height, maximum peak height and root mean square. A statistical analysis was then performed using histograms, tables, control charts, box plots and [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":1141,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[7],"tags":[166],"class_list":["post-1140","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-application-notes","tag-surface-roughness"],"_links":{"self":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/1140","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/comments?post=1140"}],"version-history":[{"count":4,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/1140\/revisions"}],"predecessor-version":[{"id":22719,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/posts\/1140\/revisions\/22719"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/media\/1141"}],"wp:attachment":[{"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/media?parent=1140"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/categories?post=1140"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanovea.com\/de\/wp-json\/wp\/v2\/tags?post=1140"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}