Surface Step Height, Depth and Thickness measurement is precisely obtained with superior Nanovea Profilometers using Chromatic Confocal 3d Non Contact Technology. With height resolution down to 2nm the 3D Nanovea Profilometer can achieve extreme accuracies with zero influence unlike that of a stylus or touch-probe. Additionally, unlike other optical techniques there is zero influence from reflectivity of materials. Step heights can be automatically calculated or manually selected, with options for both single point or average depth references.

Application Notes:
Micro Scratch Depth Measurement Using 3D Profilometery
Thin Film Thickness Measurement With 3D Profilometry

Additional Surface Measurements:
Surface Roughness Measurement
Surface Profile Measurement
Surface Topography Measurement
Surface Flatness Measurement
Surface Volume Measurement

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