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SURFACE STEP HEIGHT MEASUREMENT | DEPTH & THICKNESS

Profilometers | Technique | Optics | Applications | Application Notes | Brochure Download | Watch Video

The chromatic confocal technique accurately measures step heights up to 25mm with depth resolutions down to 2.7nm. The chromatic confocal technique is a non-destructive method for the measurement of step heights with no influence from on accuracy reflectivity or material change between coating and substrate. Thickness of an optical transparent layer can also be measured with similar resolution and range (lower limit of about 7µm).

Standards:
• ISO 5436-1

Standard Measurement Analysis:
• Point to point • Plane to plane • Maximum, minimum and mean heights • 3D or 2D map of thickness • Thickness distribution curve

Software Features:
Easily defined line or area scansRecipes • Lateral resolution • Export raw data and images • Real time display • Automatic reporting • Multi-language support
• Mapping

Analysis Software Features:
• Filtering • Leveling • Thresholding • Zooming • Area selection and form removal tools • Subtract and compare functions and many others

Advanced Automation:
• Automatic focus (optical and microscope), automatic analysis template • Multi sample handling macros • Easy selection of area under the microscope for profiling or AFM testing • Automatic dual frequency for surfaces with varying reflectivities • Rotational staging • Pattern recognition • Database communications • Pass/Fail limits
• Line sensors for up to 200 times faster measurements

Sample(s) Holders and Environmental Conditions:
• Custom and standard sample holders • Heating stage

Additional Surface Measurements:
Surface Roughness Measurement
Surface Profile Measurement
Surface Topography Measurement
Surface Flatness Measurement
Surface Volume Measurement

App Notes
Brochure