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NEWS

Press Release

2010

US Nanotechnology Instrument Manufacturer Proves the Success of R&D Stimulus
Nanometer Online Inspection With Nanovea 3D Non-Contact Profilometer

2009
Nanovea Launches Redesigned Tribometer With 3D Optical Profiler Integration
Photovoltaic Demand Highlights Nanovea Profilometers Superior Capabilities
Breakthrough Nanoindentation Testing With Image Pattern Recognition
Top Semiconductor Mfg Chooses Nanovea Profilometer Over Many
Nanovea Profilometer Receives "Class 1" Cleanroom Approval

2008
Nanovea's 3D Non-Contact Profilers Break New Ground
Nanovea's Patent Pending Non-Contact Optical Depth Sensing Technique

2007
Formula Drift Professional Racing Series 'Official Testing Equipment Supplier'

2006
New Lower Priced Modular Chromatic Confocal Optical Pens
New Multipen Turret From Offers Nine Sensor Options in One Assembly

2005
Dual Scanning Profilometry and Scanning Instrument

2004
Breakthrough Technology for Temperature Specific Mechanical Testing
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