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Today's Standard for Tomorrow's Materials. © 2010 NANOVEA
NEWS
Press Release
2010
US Nanotechnology Instrument Manufacturer Proves the Success of R&D Stimulus
Nanometer Online Inspection With Nanovea 3D Non-Contact Profilometer
2009
Nanovea Launches Redesigned Tribometer With 3D Optical Profiler Integration
Photovoltaic Demand Highlights Nanovea Profilometers Superior Capabilities
Breakthrough Nanoindentation Testing With Image Pattern Recognition
Top Semiconductor Mfg Chooses Nanovea Profilometer Over Many
Nanovea Profilometer Receives "Class 1" Cleanroom Approval
2008
Nanovea's 3D Non-Contact Profilers Break New Ground
Nanovea's Patent Pending Non-Contact Optical Depth Sensing Technique
2007
Formula Drift Professional Racing Series 'Official Testing Equipment Supplier'
2006
New Lower Priced Modular Chromatic Confocal Optical Pens
New Multipen Turret From Offers Nine Sensor Options in One Assembly
2005
Dual Scanning Profilometry and Scanning Instrument
2004
Breakthrough Technology for Temperature Specific Mechanical Testing
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