NANOVEA Profilometer | Profilometers | Profilometry | Optical Profiler

PROFILOMETERS INTRO Nanovea 3D Non-Contact Profilometers are designed with leading edge Optical Pens using superior white light axial chromatism. Nanometer resolution is obtained during measurement (Profile/Dimension, Roughness/Finish/Texture, Shape/Form/Topography, Flatness/Warpage, Volume Area, Step-Height/Depth/Thickness and others) on a wider range of geometries and materials than any other Profilometer. With the use of a large range of Optical Pens the Profilometer precisely measures an endless range of applications. For applications exceeding Profilometer capability an AFM integration is available. All Profilometers use the same Software and Nanovea PRVision is optional on most Profilometers for auto pattern recognition. Profilometer speeds range from 20mm/s to 1m/s for laboratory or research to the needs of hi-speed inspection. Nanovea Profilometers can be built with custom size, speeds, scanning capabilities, Class 1 Clean Room compliance, with Indexing Conveyor and for Inline or online Integration.For Profilometer specifications see brochure download. For Profilometer technical testing data see application notes. For video visit Nanovea YouTube. PROFILOMETERS*
	PS50 Optical Profilometer \| Limited Budget Using the same technology and software as the ST400, along with 50mm X-Y stages, the high-performance PS50 is the ideal choice to replace stylus and laser profilers. The PS50 has a small footprint (30cm x 25cm) and the option of running on a laptop, which makes for an easy installation where space is critical. Ideal option for budget limitations and small research facilities. • Compact size • 50mm x 50mm XY• Upgrade Replacement From Stylus and Laser Profilers • Budget Friendly Leading Technology
	ST400 Optical Profilometer \| Nanovea Standard 150mm X-Y stages and a large coarse height adjustment to easily accommodate larger sample sizes.The ST400 also has an optional offset camera, with either manual or motorized zooms, to easily identify small features prior to measuring them. The Custom ST400, a more open configuration, allows for the addition of larger X-Y stages to measure even larger areas, a 360° rotational stage for measuring spherical or cylindrical parts and many other custom configurations. Works well for larger samples and larger scan areas. Available with various automation options. Ideal option for diverse and expanding measurement needs. • 150mm x 150mm XY • Various Options • Spacious Platform Area for Unique Sample Size • (PRVision) Image Pattern Recognition
	CR750 Optical Profilometer \| Class 1 Clean Room Compatible The CS750 was built and approved for Class 1 Clean room use. Prior to the CR750, advanced 3D Non-Contact profiling technology was rarely available for class 1 compliance. The system was also designed with a high degree of flatness and accuracy by using precision machining and high quality components. The CR750 has an X-Y stage measurement area of 15cm x 20cm and is built on a granite base to enhance stage flatness. Ideal option for strict environments in need of compatible measurement solutions. • Class 1 Clean Room Approved • Granite Base • Various Options • (PRVision) Image Pattern Recognition
	HS1000 Optical Profilometer \| Hi-Speed Automated Inspection The HS1000 Optical Profilometer allows hi-speed inspection 50 times faster than most inspection systems in its class. Inspection speeds can reach up to 1m/s and data acquisition up to 31KHz providing crucial inspection for more time constraint production and quality control environments. The HS1000 is made mostly of granite to provide superior stability and comes with an optional enclosure workstation to create a fully contained stand-alone instrument. The HS1000 can also be equipped with an 180point line sensor to make inspection up to 180 times faster, which gives 1m/s stage speed and an acquisition rate up to 324,000. Ideal option for hi-speed automation and quality control environments. An optimized version of the HS1000 Profilometer for Photovoltaic inspection is available. The HS100/PV is capable of acquiring up to 31,000 points per second and scan areas up to 1m x 1m. Applications can range from wafer roughness, flatness, trace height to glass roughness and flatness. The HS1000/PV will be available stand alone or inline for integration into panel or wafer production lines for quality control inspection. • Hi-Speed • Automated • User Friendly Technology • (PRVision) Image Pattern Recognition • Enhanced Granite Structure • Safety Enclosure Workstation • Indexing Conveyor or Inline Integration Option • 31,000 points per second and scan areas up to 1m x 1m for inline quality control

PROFILOMETERS
3D Non-Contact Metrology
Profilometers
Optics
Software
Applications
Application Notes
Brochure Download

MECHANICAL TESTERS
Indentation | Scratch | Wear
Mechanical Testers
Nano Module
Micro/Macro Module
Optics
Software
Nano Applications
Micro/Macro Applications
Application Notes
Brochure Download

TRIBOMETERS
Wear | Friction Tribology
Tribometers
Optics
Software
Applications
Application Notes
Brochure Download

SURFACE MEASUREMENT (Nano \| Micro \| Macro Range) Profile Dimension • Roughness Finish Texture • Shape Form Topography • Flatness Warpage Coplanarity • Volume Area • Step-Height Depth • Thickness and others

PROFILOMETERS INTRO Nanovea 3D Non-Contact Profilometers are designed with leading edge Optical Pens using superior white light axial chromatism. Nanometer resolution is obtained during measurement (Profile/Dimension, Roughness/Finish/Texture, Shape/Form/Topography, Flatness/Warpage, Volume Area, Step-Height/Depth/Thickness and others) on a wider range of geometries and materials than any other Profilometer. With the use of a large range of Optical Pens the Profilometer precisely measures an endless range of applications. For applications exceeding Profilometer capability an AFM integration is available. All Profilometers use the same Software and Nanovea PRVision is optional on most Profilometers for auto pattern recognition. Profilometer speeds range from 20mm/s to 1m/s for laboratory or research to the needs of hi-speed inspection. Nanovea Profilometers can be built with custom size, speeds, scanning capabilities, Class 1 Clean Room compliance, with Indexing Conveyor and for Inline or online Integration.For Profilometer specifications see brochure download. For Profilometer technical testing data see application notes. For video visit Nanovea YouTube. PROFILOMETERS*
	PS50 Optical Profilometer \| Limited Budget Using the same technology and software as the ST400, along with 50mm X-Y stages, the high-performance PS50 is the ideal choice to replace stylus and laser profilers. The PS50 has a small footprint (30cm x 25cm) and the option of running on a laptop, which makes for an easy installation where space is critical. Ideal option for budget limitations and small research facilities. • Compact size • 50mm x 50mm XY• Upgrade Replacement From Stylus and Laser Profilers • Budget Friendly Leading Technology
	ST400 Optical Profilometer \| Nanovea Standard 150mm X-Y stages and a large coarse height adjustment to easily accommodate larger sample sizes.The ST400 also has an optional offset camera, with either manual or motorized zooms, to easily identify small features prior to measuring them. The Custom ST400, a more open configuration, allows for the addition of larger X-Y stages to measure even larger areas, a 360° rotational stage for measuring spherical or cylindrical parts and many other custom configurations. Works well for larger samples and larger scan areas. Available with various automation options. Ideal option for diverse and expanding measurement needs. • 150mm x 150mm XY • Various Options • Spacious Platform Area for Unique Sample Size • (PRVision) Image Pattern Recognition
	CR750 Optical Profilometer \| Class 1 Clean Room Compatible The CS750 was built and approved for Class 1 Clean room use. Prior to the CR750, advanced 3D Non-Contact profiling technology was rarely available for class 1 compliance. The system was also designed with a high degree of flatness and accuracy by using precision machining and high quality components. The CR750 has an X-Y stage measurement area of 15cm x 20cm and is built on a granite base to enhance stage flatness. Ideal option for strict environments in need of compatible measurement solutions. • Class 1 Clean Room Approved • Granite Base • Various Options • (PRVision) Image Pattern Recognition
	HS1000 Optical Profilometer \| Hi-Speed Automated Inspection The HS1000 Optical Profilometer allows hi-speed inspection 50 times faster than most inspection systems in its class. Inspection speeds can reach up to 1m/s and data acquisition up to 31KHz providing crucial inspection for more time constraint production and quality control environments. The HS1000 is made mostly of granite to provide superior stability and comes with an optional enclosure workstation to create a fully contained stand-alone instrument. The HS1000 can also be equipped with an 180point line sensor to make inspection up to 180 times faster, which gives 1m/s stage speed and an acquisition rate up to 324,000. Ideal option for hi-speed automation and quality control environments. An optimized version of the HS1000 Profilometer for Photovoltaic inspection is available. The HS100/PV is capable of acquiring up to 31,000 points per second and scan areas up to 1m x 1m. Applications can range from wafer roughness, flatness, trace height to glass roughness and flatness. The HS1000/PV will be available stand alone or inline for integration into panel or wafer production lines for quality control inspection. • Hi-Speed • Automated • User Friendly Technology • (PRVision) Image Pattern Recognition • Enhanced Granite Structure • Safety Enclosure Workstation • Indexing Conveyor or Inline Integration Option • 31,000 points per second and scan areas up to 1m x 1m for inline quality control