TRADE SHOWS________________________________________________________________
VISIT US AT MRS 2008 TRADE SHOW IN BOSTON
Nanovea will be displaying the PS50 White Light Optical Profiler:
Visit us at booth #1016 for a live demonstration during the exhibit hours (Dec 2nd & 3rd 11am-5:30pm & Dec 4th 10am-1:30pm) at the MRS Show in Boston. Take advantage of this opportunity to bring your samples and have them tested. There is no appointment necessary but to ensure that a measurement time is available you can send a request with an approximate time to Craig Leising craig@nanovea.com.
►For a complimentary pass to the show
LABORATORY_________________________________________________________________
NEW monthly rates available for 20, 50,100 tests per month along with priority delivery options.This is a more affordable solution for clients with reoccurring, testing needs. This solution gives access to all standard tests including scratch, wear, friction, adhesion and profilometery testing. ►For more information
From our facilities in Irvine CA, we proudly offer Contract Laboratory Services utilizing a broad range of analytical instrumentation. The Nanovea Division is also a manufacturer of mechanical and profiling testing instruments used within our laboratories. The availability of the latest technology insures optimal results with every test. Our 12 years of testing experience includes recent work in the fields of pharmacology, automotive engineering, micro-electronics, medical devices, and special coatings. Achievements include development of new techniques for measuring the adhesion of coatings on fiber optics and other cylindrical shapes. Improved methodologies for measuring the hardness and elastic modulus of porous coatings and sponges. Improved methods for measuring friction on small plastic parts for medical devices.
PRESS RELEASE_______________________________________________________________
Nanovea's 3D Non-Contact Profilers Break New Ground
November 21, 2008 -- Nanovea announced today that it’s Profiler line-up will now include a system with measurement speeds over 180 times faster. With this new advancement Nanovea’s Profiler will now have the capability to reach speeds suitable for more time constraint production and quality control environments. This new advancement in Profiler Technology is a breakthrough for use within these particular environments.
Prior to this new advancement this profiling technique had required a point-by-point measurement, which acquired single data points while the sample being measured moved back-and-forth under the optics to create 3D mapping. With this new technology there will be line of 180 measurable points that will be acquired simultaneously, which will significantly decrease the time to create a 3D mapping of the surface. “I’m excited about this new capability; this will give us the ability to work with new markets that require high throughputs.” Said Craig Leising, Product Manager, Nanovea.
The new Profiler System uses 1 x 180 array of measurement points and can scan up to 1800 lines per second to create and overall scan rate of up to 324,000 points per second. The system will be capable of measuring large areas in seconds with high resolution and can be equipped with image recognition software for high speed inspection. Options will also include a scanning mirror to create a field scanning function that will measure 180 points by 230 lines. Custom inline system will also be available. ►Profilers
INSTRUMENT ADVANCEMENTS___________________________________________________
New Compact Base Mechanical Tester was introduced to offer a more affordable solution in comparison to the Platform Base option. ►For more information
New Rotation Table is available on the Mechanical Tester series to add full Pin-On-Disk wear/friction testing at the Nano/Micro/Macro scale. This greatly extends the range of testing available on the instrument.►For more information
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